Dr. Fred O. Meyer III 
1817 W. College 
Sherman, TX 75090 
Mobile Phone: 903-819-4416 
Home E-mail: f3meyer@texoma.net

Professional Objective: A responsible position as an engineering manager, silicon engineer, silicon technologist or a quality engineer.  

 

Skills:

  • Silicon wafer characterization, contaminant analysis, defect analysis,
  • Silicon wafer engineering, process and product development
  • Management of exempt and non-exempt employees
  • 8D Quality claim problem solving and statistical process control (SPC)
  • Work well in global, culturally diverse settings
  • Strong communications, math, and computer skills

Experience:

  • September 2005-November 2005: Contract Quality Engineer for Belcan Technical Services working at SumcoUSA on epi resistivity measurement issues.
  • November 2000-April 2005: Applications Engineering Manager for Komatsu Silicon America. Responsibilities included being the direct customer contact for technical and quality issues. Technical issues included specification review and wafer production process capability. Quality issues included working through the 8D process to resolve customer quality claims. Worked with Sematech contributing to the International Technology Roadmap for Semiconductors.
  • July 1995-October 2000: Development Engineer (Member, Technical Staff) at MEMC Southwest, Sherman TX. Responsibilities included characterization physical properties of silicon wafers, contaminant analysis and defect analysis. Managed laboratory equipment and personel. Developed and maintained product databases. Developed knowledge of wafer cleaning and contaminant sources. Contributed to the International Technology Roadmap for Semiconductors.
  • February 1984 – July 1995: Development Engineer (Member, Group Technical Staff) for Silicon Products Department, Texas Instruments, Sherman, TX. . Responsibilities included characterization physical properties of silicon wafers, contaminant analysis and defect analysis. Did wafer problem solving for TI wafer fabs. Managed laboratory equipment and personel. Was company wide expert on Oi characterization. Did bulk microdefect simulations and modeling. Contributed to the National Technology Roadmap for Semiconductors.

·        May 1980 - January 1984: Process Engineer, then Engineering Section Manager in Silicon Products Department at Texas Instruments, Sherman. Responsibilities included process engineering for sililcon crystal growth, crystal prep, wafer sawing, and pre-polish wafer processing. Managed other engineers and engineering technicians.  Managed large diameter crystal growth and crystal bulk property improvement projects.

·        August 1979 - May 1980: Visiting Assistant Professor in Physics Department at North Texas State University, Denton, Tx 76201. Research topic: Rotation in rigid internal rotor molecules.

·        August 1978 - August 1979: Post Doctoral Associate at Texas Tech University, Lubbock, TX. Research topic: Extension of the Curvilinear Internal Coordinate formulation of vibration-rotational energies in molecules.

·        July 1973 - December 1974: Process Engineer in start-up of silicon crystal growth area at Texas Instruments, Sherman, TX. Supervised engineering technicians. Also Production Supervisor in crystal growth area with large crew of production operators.  

Publications, Patents, Papers:

  • 7 published articles, 1 patent, 8 presented papers. List available on request. 

Education:

  • Doctor of Philosophy in Physics from the University of North Texas, Denton, Tx 76201 in December 1978. Dissertation topic: Molecular vibration and Eckart Frame motions.
  • Master of Arts in Physics from the University of North Texas in May 1973. Thesis topic: Quantum size effects in thin films.
  • Bachelor of Science in Physics from Lamar University, Beaumont, Tx in August 1970. Minor in mathematics.

Professional Society Memberships: Electrochemical Society.